Document Details Document Type : Article In Journal  Document Title : Series resistance controlling photosensor of Ag/DNA/p-Si/Al diode Series resistance controlling photosensor of Ag/DNA/p-Si/Al diode   Subject : physics  Document Language : English  Abstract : The Ag/DNA/p-Si/Al Schottky barrier diode was fabricated using spin-coating technique. The electrical characterization of the diode was performed using current-voltage and capacitance-voltage-frequency measurements. The ideality factor and barrier height of the diode were found to be 2.26 and 0.72 eV, respectively. The photoresponse measurements indicate that the diode behaves as a photodiode. The alternative current (AC) measurements were performed in detail. The capacitance-voltage-frequency (C-V-f) measurements indicate that the capacitance of the diode depends on voltage and frequency. The observed decrease in the capacitance and increase in the conductance with increase in frequency were explained on the basis of interface states. The density of interface states of the diode is decreased with increasing frequency. It was observed that the series resistance of the diode is decreased with increasing light intensity and increased with decreasing frequency under constant light intensity.  ISSN : 0379-6779  Journal Name : SYNTHETIC METALS  Volume : 162  Issue Number : 11-12  Publishing Year : 1433 AH 2012 AD  Article Type : Article  Added Date : Tuesday, July 25, 2017  Researchers Researcher Name (Arabic) Researcher Name (English) Researcher Type Dr Grade Email R.K Gupta Gupta, R.K Investigator Doctorate ramguptamsu@gmail.com A.A Al-Ghamdi, Al-Ghamdi, A.A Researcher Doctorate   Omar A Al-Hartomy Al-Hartomy, Omar A Researcher Doctorate   H Hasar, Hasar,, H Researcher Doctorate   Farid El-Tantawy El-Tantawy, Farid Researcher Doctorate   F Yakuphanoglu Yakuphanoglu, F Researcher Doctorate   Files File Name Type Description  42242.pdf pdf   Back To Researches Page